Vu Xuan Manh, Le Hong Minh, Le Van Be and Nguyen Huy Tiep, Le Viet Cuong* 2024. Study on the effect of Ti layer on the stability of electrical measuring surface plasmon resonance sensors with ITO/aSi:H/Ti/Au structure. Version B of Vietnam Journal of Science and Technology. 66, 10DB (Oct. 2024). DOI:https://doi.org/10.31276/VJST.66(10DB).22-27.