VU XUAN MANH, LE HONG MINH; LE VAN BE; NGUYEN HUY TIEP, LE VIET CUONG*. Study on the effect of Ti layer on the stability of electrical measuring surface plasmon resonance sensors with ITO/aSi:H/Ti/Au structure. Version B of Vietnam Journal of Science and Technology, [S. l.], v. 66, n. 10DB, 2024. DOI: 10.31276/VJST.66(10DB).22-27. Disponivel em: https://b.vjst.vn/index.php/ban_b/article/view/3593. Acesso em: 7 nov. 2026.