Study on the illuminance responsivity scale realization for the national measurement standard realization ofluminous intensity

Authors

  • Xuan Quan Cao*, Ngoc Dung Hoang, Ngoc Hieu Le, Thi Thu Thuy Le, Thi Huyen Nguyen*

Keywords:

illuminance responsivity scale (A/lx), luminous intensity, SI unit, standard photometer

Abstract

In the National Measurement Institutes, establishing the basic SI units is especially important. And the illuminance responsivity scale (A/lx) unit plays a vital role in the optical measurement. This unit is used to constitute luminous intensity (candela), luminous flux (lm), and illuminance (lx) units. Among them, the candela is one of the basic SI units. Currently, there are two methods used to develop the standardized illumination sensitivity system: using a standard light source and using a standard photometer with a given illuminance responsivity scale.

To increase the accuracy of the measurement system, in this study, the authors developed the standard illuminance responsivity scale to set up illuminance responsivity units on the basis of using a standard photometer with a given illuminance responsivity scale. The developed standard illuminance responsivity sacle system (VMI-PR-006) was used to set up the illuminance responsivity scales of the standard photometer (P30SCT; S/N:      09B622; LMT-Germany company) with an uncertainty of measurement U estimated about 0.62%. As the results, the illuminance responsivity scales of the standard photometer on the VMI-PR-006 system were determined.

Classification number

1.3

Author Biography

Xuan Quan Cao*, Ngoc Dung Hoang, Ngoc Hieu Le, Thi Thu Thuy Le, Thi Huyen Nguyen

Vietnam Metrology Institute (VMI)

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Published

2017-03-25

Received: 26 December 2016; accepted: 25 January 2017

How to Cite

Cao Xuan Quan*, Hoang Ngoc Dung, Le Ngoc Hieu, Le Thi Thu Thuy, Nguyen Thi Huyen. (2017). Study on the illuminance responsivity scale realization for the national measurement standard realization ofluminous intensity. Version B of Vietnam Journal of Science and Technology, 59(3). Retrieved from https://b.vjst.vn/index.php/ban_b/article/view/520